We encourage submission of manuscripts on the following or related topics:

  1. Test and Fault Tolerance, Reliability physics and modeling
  2. Variability-aware design and tools. Temperature, aging, radiation…
  3. Ultra-low power systems
  4. Energy management and harvesting
  5. Hardware for machine learning, neural networks and high performance systems
  6. FPGAs and GPU-based accelerators
  7. Reconfigurable devices and systems
  8. IoT and applications (industry 4.0, personalized healthcare …)
  9. Educating Methods on Electronics
  10. Emerging technologies for circuits and systems (FDSOI, 3DICs, NVRAM, NWFET, silicon photonics, quantum …)
  11. Industrial applications
  12. Power Electronics – Devices & Systems
  13. Electronic and communication technologies for smart farming (special session)
  14. PhD Poster Competition (special session)

English is the official language of the conference. Manuscripts in PDF format must be electronically submitted for blind peer review through the Authors’ Area.

Paper submission relevant dates

Manuscripts, in PDF format, must be submitted electronically before April 30, 2019. Authors will be notified of paper acceptance or non-acceptance by email as close as possible to the published author notification date of July 15, 2019. The notification email will include comments from the reviewers.

Final manuscript submission of accepted papers

The final manuscripts of accepted papers, in PDF format, must be submitted electronically before September 30, 2019.

Selected papers will be included for publication in IEEExplore. The authors of selected papers will be invited to send the required IEEE Copyright form.

All accepted papers will be accessible during the conference through an online repository.

Manuscript templates

Formating should conform to the IEEE Template for Conference Proceedings: single-spaced, double-column, A4 page. Paper length is limited to 6 pages (including the complete text, all figures, tables and references).

Microsoft Word 2003
A4 (DOC, 56KB)

LaTeX Archive Contentsa
Windows (ZIP, 700KB)

LaTeX (Bibliography Files)b
Windows (ZIP, 309KB)

a The LaTeX System Tester is included in the LaTeX archives content. The package includes instructions on how to test your LaTeX system settings and reconfigure them as necessary to enable you to emulate the “control output” for the best PDF conversion. You are strongly encouraged to perform this test before laying out your final manuscript.

b Access IEEEtran LaTeX Class (template) V1.8 packages and IEEEtran V1.12 BibTeX (bibliography) packages. Be sure to use the template’s conference mode. See template documentation for details.

Please, do not include the authors’ details in the paper to be reviewed.

AUTHORS’ AREA

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